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Richard Kaplan’s reply to the previous note Subject: Reply to Reply to Comments on Lettieri/Yoneyama Article

25/04/2006 |

—–Original Message—– From: Richard D. Kaplan [mailto:rdk205@Lehigh.EDU] Sent: Saturday, March 18, 2006 2:45 PM To: editor@triz-journal.com Cc: rdk205@lehigh.edu

Subject: Reply to Reply to Comments on Lettieri/Yoneyama Article First, I want to thank Mr. Lettieri and Mr. Yoneyama for receiving my … Read More

Reply to comments on the article “Su-Field: An Educational Example of Inventive Problem Solving in Electrical Engineering”

24/04/2006 |

by Antonio Cesar Lettieri, Takashi Yoneyama

As authors of the January/2006 article, “Su-Field: An Educational Example of Inventive Problem Solving in Electrical Engineering”, we would like to contribute with some additional material based on the comments by Richard Kaplan, published … Read More

Comments And Reply About “Invention Quality Measurement (IQM) 1. Patent Valuation. The Methods That TRIZ Forgot” (TRIZ Journal, Sept. 2003)

25/10/2003 |

Comments and reply about “Invention Quality Measurement (IQM) 1. Patent Valuation. The Methods That TRIZ Forgot” (TRIZ Journal, Sept. 2003)

From Jose Vicente: Firstly to say that the title is for me good enough. Up today most people, including those … Read More